The shift to multi-die assemblies is forcing changes in how chips are tested and inspected in order to achieve sufficient yield ramp or respond more quickly to yield excursions.

Inspecting and testing physical evidence is useful, if not necessary, in many product liability cases that involve direct evidence of a specific product defect. From simple to complex cases, a product ...

While many articles have been written about cell testing in R&D labs or cell testing during manufacturing in the factory, let’s turn to the topic of cell testing for incoming inspection. This article ...